Electrical Uniformity Mapping of Carbon Nanotube Thin-Films using Non-invasive Surface Contact Probing Technique, Eunsuk Choi, Chaehyun Lim, Kunhak Lee, Ahsung Lim, Jinoh Kim, and Seung-Beck Lee, Asia-Pacific Productivity Conference (APPC) 2010 Nobember 16, 2010 Shanghai, China

 

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