Improvement of Threshold voltage shift distribution characteristic in double layer NiSi2 nanocrystals for nano_floating gate memory , Sung-Jin Choi, Donghyoun Kim, Wangyu Song, Jihun Kwon, and Seung-Beck Lee, IEEE NANO 2010-Joint Symposium with NANO KOREA  2010 August 19, 2010 KINTEX, Korea

 

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